Built-in Self Test Power and Test Time Analysis in On-chip Networks

@article{Senejani2015BuiltinST,
  title={Built-in Self Test Power and Test Time Analysis in On-chip Networks},
  author={Mahdieh Nadi Senejani and Mahdiar Hosein Ghadiry and Chia Yee Ooi and Muhammad N. Marsono},
  journal={CSSP},
  year={2015},
  volume={34},
  pages={1057-1075}
}