Built-In Self-Test of configurable logic blocks in Virtex-5 FPGAs

Abstract

A Built-In Self-Test (BIST) approach is presented for the configurable logic blocks (CLBs) in Xilinx Virtex-5 Field Programmable Gate Arrays (FPGAs). A total of 17 configurations were developed to completely test the full functionality of the CLBs, including distributed RAM modes of operation. These configurations cumulatively detect 100% of stuck-at faults… (More)

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