Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS

  title={Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS},
  author={Th. Calin and Lorena Anghel and Michael Nicolaidis},
This paper describes results on Built-In Current Sensors destined to overcome the limitations of Inno testing in deep submicron circuits. The problems of per$ormance penalty, test accuracy and test speed are addressed. A new sensor composed of a source-controlled comparator operating at low supply voltages and bias currents is used. Gradual sensor activation ensures reliable low noise operation. It is combined with large bypass MOS switches avoiding peflormance penalty, as well as a second… CONTINUE READING


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