Broadcast test pattern generation considering skew-insertion and partial-serial scan

Abstract

Broadcast scan test patterns suffer low fault detection efficiency due to the broadcast induced test pattern constraints. This paper presents a test pattern generation technique for broadcast scan that's capable of skew insertion and partial-serial scan — the former alters while the latter partially removes the test pattern constraints due to the broadcast mechanism. The proposed test pattern generator integrates the skew insertion and partial-serial scan capability into its decision-making procedure; this tight hardware/software integration achieves high fault coverage and compression performance without modifying the circuit under test. Experimental results on ISCAS89 and ITC99 benchmark circuits are presented to validate its effectiveness.

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Cite this paper

@article{Lin2011BroadcastTP, title={Broadcast test pattern generation considering skew-insertion and partial-serial scan}, author={Chien-Ju Lin and Jiun-Lang Huang}, journal={Proceedings of 2011 International Symposium on VLSI Design, Automation and Test}, year={2011}, pages={1-4} }