Brillouin scattering study on the wave properties in thin SiC films.

Abstract

The modified Rayleigh wave velocities on the SiC hetero-epitaxial films have been investigated using a Brillouin scattering technique. The SiC nanoscopic films were formed on clean surface of Si substrates by the molecular ion beam technique or Ion beam induced chemical vapor deposition. Back scattering geometry was used to obtain the ripple Brillouin… (More)

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@article{Matsukawa2004BrillouinSS, title={Brillouin scattering study on the wave properties in thin SiC films.}, author={Mami Matsukawa and Satoshi Murata and Takashi Matsumoto and Takaomi Matsutani and Masato Kiuchi}, journal={Ultrasonics}, year={2004}, volume={42 1-9}, pages={391-4} }