Bregman-EM-TV Methods with Application to Optical Nanoscopy

Abstract

Measurements in nanoscopic imaging suffer from blurring effects concerning different point spread functions (PSF). Some apparatus even have PSFs that are locally dependent on phase shifts. Additionally, raw data are affected by Poisson noise resulting from laser sampling and "photon counts" in fluorescence microscopy. In these applications standard… (More)
DOI: 10.1007/978-3-642-02256-2_20

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