Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale

  title={Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale},
  author={Eric Betzig and Jay Kenneth Trautman and Timothy D. Harris and J. S. Weiner and Robert L. Kostelak},
  pages={1468 - 1470}
In near-field scanning optical microscopy, a light source or detector with dimensions less than the wavelength (λ) is placed in close proximity (λ/50) to a sample to generate images with resolution better than the diffraction limit. A near-field probe has been developed that yields a resolution of ∼12 nm (∼λ/43) and signals ∼104- to 106-fold larger than those reported previously. In addition, image contrast is demonstrated to be highly polarization dependent. With these probes, near-field… Expand

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