• Corpus ID: 118087027

Break-up phenomena of liquid metal thin film induced by high electric current

@article{Ma2013BreakupPO,
  title={Break-up phenomena of liquid metal thin film induced by high electric current},
  author={Rongchao Ma and Cangran Guo and Yi-xin Zhou and Jing Liu},
  journal={arXiv: Materials Science},
  year={2013}
}
  • R. Ma, Cangran Guo, +1 author J. Liu
  • Published 3 September 2013
  • Materials Science, Physics
  • arXiv: Materials Science
The room temperature liquid metal related electronics has been found important in a wide variety of emerging areas over the past few years. However, its failure features under high electrical current densities are not clear until now. Here we show that a liquid metal thin film would break-up as the applied current increases to a critical magnitude. The break-up phenomenon is attributed to be caused by the so-called electromigration effect. This problem could be one of the major hurdles that… 

References

An Introduction to Fluid Dynamics
This brief paper derives Euler’s equations for an inviscid fluid, summarizes the Cauchy momentum equation, derives the Navier-Stokes equation from that, and then talks about finite difference method