Boron nitride sample carriers for total-reflection X-ray fluorescence

@inproceedings{Prange1993BoronNS,
  title={Boron nitride sample carriers for total-reflection X-ray fluorescence},
  author={Andreas Prange and Karsten Kramer and Ulrich Reus},
  year={1993}
}
Abstract Pyrolytic boron nitride (PBN) is examined with respect to its suitability as a material for total-reflection X-ray fluorescence spectrometry (TXRF) sample carriers. Surface properties of polished specimens such as flatness and roughness were measured and found to be comparable, but slightly worse than those of the usual quartz carriers. Chemical resistance of PBN is outstanding, with no corrosive attack by concentrated acids or strong alkali being observed. Test spectra measured with… CONTINUE READING