Bonding Structures of ZrHx Thin Films by X-ray Spectroscopy

@article{Magnuson2017BondingSO,
  title={Bonding Structures of ZrHx Thin Films by X-ray Spectroscopy},
  author={Martin Magnuson and Fredrik L. Eriksson and Lars Hultman and Hans Hogberg},
  journal={Journal of Physical Chemistry C},
  year={2017},
  volume={121},
  pages={25750-25758}
}
  • Martin Magnuson, Fredrik L. Eriksson, +1 author Hans Hogberg
  • Published 2017
  • Chemistry, Physics
  • Journal of Physical Chemistry C
  • The variation in local atomic structure and chemical bonding of ZrHx (x = 0.15, 0.30, and 1.16) magnetron sputtered thin films are investigated by Zr K-edge (1s) X-ray absorption near-edge structure and extended X-ray absorption fine structure spectroscopies. A chemical shift of the Zr K-edge toward higher energy with increasing hydrogen content is observed due to charge-transfer and an ionic or polar covalent bonding component between the Zr 4d and the H 1s states with increasing valency for… CONTINUE READING

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