Body Bias Voltage Computations for Process and Temperature Compensation

@article{Kumar2008BodyBV,
  title={Body Bias Voltage Computations for Process and Temperature Compensation},
  author={Sanjay V. Kumar and Chris H. Kim and Sachin S. Sapatnekar},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2008},
  volume={16},
  pages={249-262}
}
With continued scaling into the sub-90-nm regime, the role of process, voltage, and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. These variations can cause the delay and the leakage of the chip to vary significantly from their expected values, thereby affecting the yield. Circuit designers have proposed the use of threshold voltage modulation techniques to pull back the chip to the nominal operational region. One such scheme, known as adaptive… CONTINUE READING
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