Board test coverage: the value of prediction and how to compare numbers

@article{Rijckaert2003BoardTC,
  title={Board test coverage: the value of prediction and how to compare numbers},
  author={Wouter Rijckaert and Frans de Jong},
  journal={International Test Conference, 2003. Proceedings. ITC 2003.},
  year={2003},
  volume={1},
  pages={1277-1277}
}
Test coverage prediction for board assemblies has an important function in, among others, test engineering, test cost modeling, test strategy definition and product quality estimation. Introducing a method that defines how this coverage is calculated can increase the value of such prediction across the electronics industry. There are three aspects to test coverage calculation: fault modeling, coverage-per-fault and total coverage. An abstraction level for fault categories is introduced, called… CONTINUE READING

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