BlackJack: Hard Error Detection with Redundant Threads on SMT

@article{Schuchman2007BlackJackHE,
  title={BlackJack: Hard Error Detection with Redundant Threads on SMT},
  author={Ethan Schuchman and T. N. Vijaykumar},
  journal={37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)},
  year={2007},
  pages={327-337}
}
Testing is a difficult process that becomes more difficult with scaling. With smaller and faster devices, tolerance for errors shrinks and devices may act correctly under certain condition and not under others. As such, hard errors may exist but are only exercised by very specific machine state and signal pathways. Targeting these errors is difficult, and creating test cases that cover all machine states and pathways is not possible. In addition, new complications during burn-in may mean latent… CONTINUE READING
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Effect of cmos technology scaling on thermal management during burn-in

  • O. Semenov, A. Vassighi, M. Sachdev, A. Keshavarzi, C. F. Hawkins
  • IEEE Transactions on Semiconductor Manufacturing
  • 2003
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