Bist Reseeding with very few Seeds

@inproceedings{AlYamani2003BistRW,
  title={Bist Reseeding with very few Seeds},
  author={Ahmad A. Al-Yamani and Subhasish Mitra and Edward J. McCluskey},
  booktitle={VTS},
  year={2003}
}
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of deterministic seeds required is directly proportional to the tester storage or hardware overhead requirement. In this paper, we present an algorithm for seed ordering to minimize the number of seeds required to cover a set of deterministic test patterns. Our technique is applicable whether seeds are loaded from the tester or… CONTINUE READING
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