Bist Reseeding with very few Seeds

  title={Bist Reseeding with very few Seeds},
  author={Ahmad A. Al-Yamani and Subhasish Mitra and Edward J. McCluskey},
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of deterministic seeds required is directly proportional to the tester storage or hardware overhead requirement. In this paper, we present an algorithm for seed ordering to minimize the number of seeds required to cover a set of deterministic test patterns. Our technique is applicable whether seeds are loaded from the tester or… CONTINUE READING
Highly Cited
This paper has 41 citations. REVIEW CITATIONS


Publications citing this paper.
Showing 1-10 of 30 extracted citations


Publications referenced by this paper.
Showing 1-10 of 20 references

LFSR-Coded Test Patterns for Scan Designs,

  • B. Koenemann
  • Proc. of European Test Conference,
  • 1991
Highly Influential
4 Excerpts


  • N. Touba, E.J
  • “Altering Bit Sequence to Contain Predetermined…
  • 2000

System for Test Data Storage Reduction,

  • B. Koenemann
  • US Patent 6,041,429,
  • 2000
1 Excerpt


  • C. Fagot, O. Gascuel, C P. Girard
  • “On Calculating Efficient LFSR Seeds for BuiltIn…
  • 1999
1 Excerpt


  • M. Lempel, M S. Gupta
  • “Test Embedding with Discrete Logarithms,” IEEE…
  • 1995
1 Excerpt

Similar Papers

Loading similar papers…