Bending Multilayers - A Simple Method to Increase the Sensitivity of TXRF


Using diffraction x-ray tubes (2 kW) as the excitation source in Total Reflection X-ray Fluorescence Analysis (TXRF) results in less photon flux on the sample compared to the excitation with rotating anode tubes (18 kW) or synchrotron radiation. An efficient way of increasing the photon flux on the sample is the insertion of x-ray optical elements in the… (More)


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