Balanced excitation and its effect on the fortuitous detection of dynamic defects

  title={Balanced excitation and its effect on the fortuitous detection of dynamic defects},
  author={Jennifer Dworak and Brad Cobb and James Wingfield and M. Ray Mercer},
  journal={Proceedings Design, Automation and Test in Europe Conference and Exhibition},
  pages={1066-1071 Vol.2}
Dynamic defects are less likely to be fortuitously detected than static defects because they have more stringent detection requirements. We show that (in addition to more site observations) balanced excitation is essential for detection of these defects, and we present ametric for estimating this degree of balance. We also show that excitation balance correlates with the parameter ¿ in the MPG-D defective part level model. 
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