Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

@article{Desplats2001BacksideLO,
  title={Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation},
  author={Romain Desplats and Felix Beaudoin and Philippe Perdu and Patrick Poirier and David Tr{\'e}mouilles and Marise Bafleur and Dean Lewis},
  journal={Microelectronics Reliability},
  year={2001},
  volume={41},
  pages={1539-1544}
}

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