BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

@article{Angot2013BTIVF,
  title={BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset},
  author={D. Angot and V. Huard and Lama Rahhal and A. Cros and X. Federspiel and A. Bajolet and Yann Carminati and M. Saliva and E. Pion and Florian Cacho and Alain Bravaix},
  journal={2013 IEEE International Electron Devices Meeting},
  year={2013},
  pages={15.4.1-15.4.4}
}
This paper presents understandings on BTI variability based upon an extensive dataset. This enables to select between various theoretical statistical models and to propose a novel description approach for the NBTI-induced mismatch for different technological nodes and a comparison with time-zero variability. The impact from transistor to gate level is also evaluated. 
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The statistics of NBTI-induced VT and β mismatch shifts in pMOSFETs

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