BIST and production testing of ADCs using imprecise stimulus

@article{Parthasarathy2003BISTAP,
  title={BIST and production testing of ADCs using imprecise stimulus},
  author={Kumar L. Parthasarathy and Turker Kuyel and Dana Price and Le Jin and Degang Chen and Randall L. Geiger},
  journal={ACM Trans. Design Autom. Electr. Syst.},
  year={2003},
  volume={8},
  pages={522-545}
}
A new approach for testing mixed-signal circuits based upon using imprecise stimuli is introduced. Unlike most existing Built-In Self-Test (BIST) and production test approaches that require excitation signals that are at least 3 bits or more linear than the Device-Under-Test (DUT), the proposed approach can work with stimuli that are several bits less… CONTINUE READING