Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced dc magnetic field sensitivity

@inproceedings{Dreau2011AvoidingPB,
  title={Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced dc magnetic field sensitivity},
  author={Anais Dr'eau and Margarita A. Lesik and Loic Rondin and Piernicola Spinicelli and Olivier Arcizet and J.-F. Roch and V. Ong-Meang Jacques},
  year={2011}
}
We report a systematic study of the magnetic field sensitivity of a magnetic sensor based on a single Nitrogen-Vacancy (NV) defect in diamond, by using continuous optically detected electron spin resonance (ESR) spectroscopy. We first investigate the behavior of the ESR contrast and linewidth as a function of the microwave and optical pumping power. The experimental results are in good agreement with a simplified model of the NV defect spin dynamics, yielding to an optimized sensitivity around… CONTINUE READING
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