Autonomous transient fault emulation on FPGAs for accelerating fault grading

@article{LpezOngil2005AutonomousTF,
  title={Autonomous transient fault emulation on FPGAs for accelerating fault grading},
  author={Celia L{\'o}pez-Ongil and Mario Garc{\'i}a-Valderas and Marta Portela-Garc{\'i}a and Luis Entrena},
  journal={11th IEEE International On-Line Testing Symposium},
  year={2005},
  pages={43-48}
}
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Therefore, hardened circuits are currently required in many applications where fault tolerance (FT) was not a requirement in the very near past. The use of CAD tools, for the generation and the validation of fault tolerant circuits, will allow designers to obtain hardened devices in a cost-effective way… CONTINUE READING

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