Automatic test generation for verifying microprocessors

@article{Corno2005AutomaticTG,
  title={Automatic test generation for verifying microprocessors},
  author={Fulvio Corno and E. Sanchez and M. Sonza Reorda and Giovanni Squillero},
  journal={IEEE Potentials},
  year={2005},
  volume={24},
  pages={34-37}
}
A pipelined processor with a high-level behavioral HDL description is presented in this paper. It generates a set of effective test programs by using a simulator, which is able to evaluate with respect to an RTL coverage metric. The proposed optimizer is based on a technique called microGP, an evolutionary system able to automatically device and optimizes the program written in an assembly language. Quantitative coverage measurement presented will guide the test-program generation. The approach… CONTINUE READING

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