Automatic Test Program Generation for Mixed Signal ICs via Design to Test Link

@inproceedings{Kao1992AutomaticTP,
  title={Automatic Test Program Generation for Mixed Signal ICs via Design to Test Link},
  author={William Kao and Jean Xia and Tom Boydston},
  booktitle={ITC},
  year={1992}
}
Test development is without doubt the major bottleneck in the product delivery cycle of mixed signal ICs [ 11. One of the most time consuming tasks is to create the test programs to run a mixed signal tester. On the digital side automatic test pattern generators exist today, but for the analog and mixed signal tester rarely any tools exist that can automatically generate test programs. This paper describes a new methodology and set of tools that allow the design and/or test engineer to capture… CONTINUE READING

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