Automatic Test Generation Using Quadratic 0-1 Programming

@inproceedings{Chakradhar1990AutomaticTG,
title={Automatic Test Generation Using Quadratic 0-1 Programming},
author={Srimat T. Chakradhar and Vishwani D. Agrawal and Michael L. Bushnell},
booktitle={DAC},
year={1990}
}

We recently proposed an unconventional digital circuit modeling technique and formulated test generation as an energy minimization problem [7]. Although energy minimization is as hard as test generation, the new approach has two advantages. Since the circuit function is mathematically expressed, operations research techniques like linear and non-linear programming can be applied to test generation. The non-causal form of the model makes parallel processing possible. The energy function E, a… CONTINUE READING