Automatic Identification of Impairments Using Support Vector Machine Pattern Classification on Eye Diagrams

@article{Skoog2006AutomaticIO,
  title={Automatic Identification of Impairments Using Support Vector Machine Pattern Classification on Eye Diagrams},
  author={R. A. Skoog and T C Banwell and J. W. Gannett and S. Habiby and Ming Pang and M. Rauch and Paul A Toliver},
  journal={IEEE Photonics Technology Letters},
  year={2006},
  volume={18},
  pages={2398-2400}
}
We have demonstrated powerful new techniques for identifying the optical impairments causing the degradation of an optical channel. We use machine learning and pattern classification techniques on eye diagrams to identify the optical impairments. These capabilities can enable the development of low-cost optical performance monitors having significant diagnostic capabilities 
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