Automated trace signals selection using the RTL descriptions

@article{Ko2010AutomatedTS,
  title={Automated trace signals selection using the RTL descriptions},
  author={Ho Fai Ko and Nicola Nicolici},
  journal={2010 IEEE International Test Conference},
  year={2010},
  pages={1-10}
}
Pre-silicon verification has been traditionally used for eliminating design bugs before tape-out. However, due to the increasing design complexity and the limited accuracy in circuit modelling, the number of the design errors that escape to silicon continues to grow. This is aggravated by the interactions between multiple clock and power domains in the modern system-on-a-chip devices. As a result, structured methods for post-silicon debugging, which aim to detect and localize the bug escapes in… CONTINUE READING
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