Automated probe microscopy via evolutionary optimization at the atomic scale

Abstract

We use numerical simulations to investigate the effect of electrostatics on the source and drain contacts of carbon nanotube field‐effect transistors. We find that unscreened charge on the nanotube at the contact‐channel interface leads to a potential barrier that can significantly hamper transport through the device. This effect is largest for intermediate gate voltages and for contacts near the ohmic‐Schottky crossover, but can be mitigated with a reduction in the gate oxide thickness. These results help to elucidate the important role that contact geometry plays in the performance of carbon nanotube electronic devices.

Cite this paper

@inproceedings{Woolley2011AutomatedPM, title={Automated probe microscopy via evolutionary optimization at the atomic scale}, author={Richard A. J. Woolley and Julian Stirling and Adrian Radocea and Natalio Krasnogor and Aron W. Cummings and Jem-Kun Chen and B Bai and Feng-Chih Chang and Cheng Wang and Shreyas V. Jalikop and Sascha Hilgenfeldt and Di Wu and Xenofon D. Koutsoukos}, year={2011} }