Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test

@article{Ko2008AutomatedSC,
  title={Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test},
  author={Ho Fai Ko and Nicola Nicolici},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  year={2008},
  volume={27},
  pages={2092-2097}
}
Scan chain division has been successfully used to control shift power by enabling mutually exclusive flip-flops at different times during the scan cycle. However, to control capture power without losing transition fault coverage during at-speed scan test, the existing automatic test pattern generation (ATPG) flows need to be modified. In this paper, we present a novel scan chain division algorithm that analyzes the signal dependencies and creates the circuit partitions such that both shift and… CONTINUE READING
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