Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy

Abstract

Nasim Alem,1,2 Rolf Erni,3,4 Christian Kisielowski,3,4 Marta D. Rossell,3,4 Will Gannett,1,3 and A. Zettl1,2,3,* 1Department of Physics, University of California at Berkeley, Berkeley, California 94720, USA 2Center of Integrated Nanomechanical Systems, University of California at Berkeley, Berkeley, California 94720, USA 3Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA 4National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA Received 19 June 2009; published 12 October 2009

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Cite this paper

@inproceedings{Alem2009AtomicallyTH, title={Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy}, author={Nasim Alem and Rolf Erni and C Kisielowski and Marta D. Rossell and Will J Gannett and Alex Zettl}, year={2009} }