Atomic-scale roughness effect on capillary force in atomic force microscopy.

Abstract

We study the capillary force in atomic force microscopy by using Monte Carlo simulations. Adopting a lattice gas model for water, we simulated water menisci that form between a rough silicon-nitride tip and a mica surface. Unlike its macroscopic counterpart, the water meniscus at the nanoscale gives rise to a capillary force that responds sensitively to the tip roughness. With only a slight change in tip shape, the pull-off force significantly changes its qualitative variation with humidity.

Cite this paper

@article{Jang2006AtomicscaleRE, title={Atomic-scale roughness effect on capillary force in atomic force microscopy.}, author={Joonkyung Jang and Mark Ratner and George C Schatz}, journal={The journal of physical chemistry. B}, year={2006}, volume={110 2}, pages={659-62} }