At-speed scan test with low switching activity

  title={At-speed scan test with low switching activity},
  author={Elham K. Moghaddam and Janusz Rajski and Sudhakar M. Reddy and Mark Kassab},
  journal={2010 28th VLSI Test Symposium (VTS)},
This paper presents a novel method to generate test vectors that mimic functional operation from switching activity point of view. The method uses states obtained by applying a number of functional clock cycles starting from the scan-in state of a test vector to fill the unspecified scan cell values in test cubes. Experimental results presented for industrial circuits demonstrate the effectiveness of the proposed method. 
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