At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester


In SoC designs, limited test access to internal cores, low-cost external tester's lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore, this paper presents an embedded micro-tester for testing IEEE1500-compliant SoCs. In the proposed approach, the test program is no more executed by the external tester but by the… (More)
DOI: 10.1109/VTS.2007.16


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