Assignment and Reordering of Incompletely Specified Pattern Sequences Targetting Minimum Power Dissipation

  title={Assignment and Reordering of Incompletely Specified Pattern Sequences Targetting Minimum Power Dissipation},
  author={Paulo F. Flores and Jos{\'e} C. Costa and Hor{\'a}cio C. Neto and Jos{\'e} C. Monteiro and Joao Marques-Silva},
  booktitle={VLSI Design},
For a significant number of electronic systems used in safety-critical applications circuit testing is performed periodically. For these systems, power dissipation due to Built-In Self Test (BIST) can represent a significant percentage of the overall power dissipation. One approach to minimize power consumption in these systems consists of test pattern sequence reordering. Moreover, a key observation is that test patterns are in general expected to exhibit don't cares, which can naturally be… CONTINUE READING
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