Argon Broad Ion beam sectioning and high resolution scanning electron microscopy imaging of hydrated alite

@inproceedings{Kleiner2021ArgonBI,
  title={Argon Broad Ion beam sectioning and high resolution scanning electron microscopy imaging of hydrated alite},
  author={Florian Kleiner and Christian Matthes and Christiane Rossler},
  year={2021}
}
Scanning electron microscopy (SEM) imaging is able to visualize microto nano-structures of cement and concrete. A prerequisite is that the sample preparation preserves the native structure of the specimen. In this study, argon Broad Ion Beam (BIB) sectioning is compared to state-of-the-art sample preparation (resin embedding, polishing) for hydrated alite. Additionally, it is investigated if during BIB, sample cooling is beneficial to avoid deterioration of cement hydrates. The aim is to… Expand

References

SHOWING 1-10 OF 42 REFERENCES
Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis--importance of epoxy impregnation
Representative and quantitative microstructural information of cement-based materials can be obtained in the backscattered electron and X-ray modes of the scanning electron microscope (SEM). OneExpand
Argon broad ion beam tomography in a cryogenic scanning electron microscope: a novel tool for the investigation of representative microstructures in sedimentary rocks containing pore fluid
TLDR
The whole system (BIB‐cryo‐SEM) provides a first generation of a novel multibeam electron microscope that combines broad ion beam with cryogenic facilities in a conventional SEM to produce large, high‐quality cross‐sections at cryogenic temperature to be imaged at the state‐of‐the‐art SEM resolution. Expand
Backscattered electron imaging of cementitious microstructures: Understanding and quantification
During the last 20 years, backscattered electron imaging of polished surfaces has become well established as a method for the study of cement and concrete microstructures. The technique has manyExpand
Transmission Electron Microscopy and Microanalytical Studies of Ion-Beam-Thinned Sections of Tricalcium Silicate Paste
Mature tricalcium silicate cement pastes were examined in ion-beam-thinned sections. The microstructure consisted of very homogeneous amorphous hydrate gel surrounding residual unhydrated cores ofExpand
Microstructure and microanalysis of hardened ordinary Portland cement pastes
Hardened ordinary Portland cement pastes of various ages have been examined by analytical transmission electron microscopy (TEM) and electron microprobe analysis (EMPA). The stability of the variousExpand
Heating of TEM specimens during ion milling.
TLDR
A series of experiments is conducted using an age-hardenable aluminium alloy which produces a trace of peak temperature attained by TEM specimens during ion milling, shown that peak temperatures of the order of 650 K can be attained using conventional milling parameters. Expand
Limited‐Dose Electron Microscopy Reveals the Crystallinity of Fibrous C–S–H Phases
Using electron diffraction, we demonstrate that the fibrous calcium-silicate-hydrates (C-S-H) of tricalciumsilicate (C 3 S) hydration possess a crystalline structure. The crystalline nature wasExpand
Triple ion beam cutting of diamond/Al composites for interface characterization
Abstract A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far.Expand
BACKSCATTERED ELECTRON IMAGES OF POLISHED CEMENT SECTIONS IN THE SCANNING ELECTRON MICROSCOPE
Using a pair of backscattered electron detectors in the scanning electron microscope, images can be produced in which the intensity is dependent solely on the molecular weight of the imaged area, andExpand
Advantages of Broad Ion Beam (BIB) Processing Compared with Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids
Ion beam processing of heterogeneous samples has proved as a versatile method for 3D investigation of microstructures. Broad ion beams are used for conventional ion etching, polishing, thinning,Expand
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