Architecture and design of an open ATE to incubate the development of third-party instruments

  title={Architecture and design of an open ATE to incubate the development of third-party instruments},
  author={R. Rajsuman and M. Noriyuki and K. Yamashita},
  journal={IEEE Transactions on Instrumentation and Measurement},
  • R. Rajsuman, M. Noriyuki, K. Yamashita
  • Published 2005
  • Computer Science, Engineering
  • IEEE Transactions on Instrumentation and Measurement
  • To test next-generation system-on-a-chip (SoC) ICs, an open architecture automatic test equipment (ATE) has been conceived. Open architecture provides a framework to integrate software and instruments of different vendors into the ATE. The specifications of this framework, known as OPENSTAR specifications, have been developed by the Semiconductor Test Consortium (STC). The deployment of third-party instruments and modules in this framework is plug-and-play to achieve the optimal test… CONTINUE READING
    Practices in Mixed-Signal and RF IC Testing
    • 20
    Economic Analysis of the HOY Wireless Test Methodology
    • 8
    Electronic test technology curriculum revisiting
    • 3
    • Highly Influenced
    Test Integration for SOC Supporting Very Low-Cost Testers
    • 3
    • Highly Influenced
    Power Management Device Characteristics for Semiconductor Test Instrumentation
    • 1


    Publications referenced by this paper.
    The rational unified process
    • 495
    • PDF
    An overview of the open architecture test system
    • 8
    Open architecture test system: system architecture and design
    • 8
    How to employ multi-GHz analog and RF modules in open architecture ATE
    • 1
    Module Based Flexible Semiconductor Test System
    • 2003
    Open Architecture ATE Tackles Test Woes
    • 2003
    Open architecture carrier module adapts PXI instruments for IC test
    • 2004
    Open architecture testers — Year one : Does reality match the vision
    • 2004
    The nuts and bolts of the open architecture test system
    • 2004