Architecture and design of an open ATE to incubate the development of third-party instruments

@article{Rajsuman2005ArchitectureAD,
  title={Architecture and design of an open ATE to incubate the development of third-party instruments},
  author={R. Rajsuman and M. Noriyuki and K. Yamashita},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2005},
  volume={54},
  pages={1678-1698}
}
  • R. Rajsuman, M. Noriyuki, K. Yamashita
  • Published 2005
  • Computer Science, Engineering
  • IEEE Transactions on Instrumentation and Measurement
  • To test next-generation system-on-a-chip (SoC) ICs, an open architecture automatic test equipment (ATE) has been conceived. Open architecture provides a framework to integrate software and instruments of different vendors into the ATE. The specifications of this framework, known as OPENSTAR specifications, have been developed by the Semiconductor Test Consortium (STC). The deployment of third-party instruments and modules in this framework is plug-and-play to achieve the optimal test… CONTINUE READING
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