Architecting Millisecond Test Solutions for Wireless Phone RFIC's

@inproceedings{Ferrario2002ArchitectingMT,
  title={Architecting Millisecond Test Solutions for Wireless Phone RFIC's},
  author={John Ferrario and Randy Wolf and Steve Moss},
  booktitle={ITC},
  year={2002}
}
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IBM test development group developed a strategy and design to test complex wireless phone front end components for a fraction of the cost of using traditional ATE or rack and stack test solutions. In this paper the architecture of the system is described as well as some of the design, maintenance and implementation… CONTINUE READING
Highly Cited
This paper has 40 citations. REVIEW CITATIONS