Applications of Artificial Neural Networks to RF and Microwave Measurements

  title={Applications of Artificial Neural Networks to RF and Microwave Measurements},
  author={Jeffrey A. Jargon and Kishan Chand Gupta and Donald C. DeGroot},
This article describes how artificial neural networks (ANNs) can be used to benefit a number of RF and microwave measurement areas including vector network analysis (VNA). We apply ANNs to model a variety of on-wafer and coaxial VNA calibrations, including open-short-load-thru (OSLT) and line-reflect-match (LRM), and assess the accuracy of the calibrations using these ANN-modeled standards. We find that the ANN models compare favorably to benchmark calibrations throughout the frequencies they… CONTINUE READING
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