Applications of Artificial Neural Networks to RF and Microwave Measurements

@inproceedings{Jargon2001ApplicationsOA,
  title={Applications of Artificial Neural Networks to RF and Microwave Measurements},
  author={Jeffrey A. Jargon and Kishan Chand Gupta and Donald C. DeGroot},
  year={2001}
}
This article describes how artificial neural networks (ANNs) can be used to benefit a number of RF and microwave measurement areas including vector network analysis (VNA). We apply ANNs to model a variety of on-wafer and coaxial VNA calibrations, including open-short-load-thru (OSLT) and line-reflect-match (LRM), and assess the accuracy of the calibrations using these ANN-modeled standards. We find that the ANN models compare favorably to benchmark calibrations throughout the frequencies they… CONTINUE READING
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Marks, LRM probe-tip calibrations with imperfect resistors and lossy lines

  • R.B.D.F. Williams
  • Proc 42nd ARFTG Conference Digest,
  • 1993
Highly Influential
6 Excerpts

Artificial neural network modeling for improved onwafer OSLT calibration standards

  • J. A. Jargon, K. C. Gupta, D. C. DeGroot
  • Int J RF and Microwave CAE
  • 2000
12 Excerpts

Neural networks for RF and microwave design

  • Q. J. Zhang, K. C. Gupta
  • 2000
2 Excerpts

Jargon, Equivalent circuit models for coaxial OSLT standards

  • D. C. DeGroot, K. L. Reed, J.A
  • Proc 54th ARFTG Conference Digest,
  • 1999
1 Excerpt

LRM probetip calibrations with imperfect resistors and lossy lines

  • R. B. Marks
  • 1999

Permittivity determination by using an artificial neural network

  • P. G. Bartley, R. W. McClendon, S. O. Nelson
  • IEEE Instrum and Meas Tech Conference
  • 1999
1 Excerpt

The effect of load variations on onwafer lumped element based calibrations

  • R. B. Marks, L. Dunleavy P. Kirby, T. Weller
  • 1999

and T

  • P. Kirby, L. Dunleavy
  • Weller, The effect of load variations on on-wafer…
  • 1999

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