Application of photoelectron spectromicroscopy to a systematic study of toxic and natural elements in neurons.

Abstract

A systematic photoelectron spectromicroscopy study is presented of the spatial distribution of a toxic element, aluminium, iron or chromium, in neuron cultures, after exposure to a solution of the element. The study was performed by the X-ray secondary-emission microscopy (XSEM) version of photoelectron Spectromicroscopy. The distribution of the elements was investigated with two complementary approaches: digital subtraction imaging and individual X-ray absorption spectra from microscopic areas. The results coherently indicate different localization patterns for different elements, and, in particular, extreme localization of aluminium to a few rare cells identifiable as Purkinje neurons. In the case of iron-exposed specimens, the distribution analysis was extended to naturally present phosphorus, and used to estimate the XSEM sensitivity.

Cite this paper

@article{Stasio1995ApplicationOP, title={Application of photoelectron spectromicroscopy to a systematic study of toxic and natural elements in neurons.}, author={Gelsomina De Stasio and Daniel Dunham and Brian Tonner and Delio Mercanti and M T Ciotti and Patricia Perfetti and G. Margaritondo}, journal={Journal of synchrotron radiation}, year={1995}, volume={2 Pt 2}, pages={106-12} }