Application Note 1037 Embedded IEEE 1149.1 Test Application Example

@inproceedings{Semiconductor1998ApplicationN1,
  title={Application Note 1037 Embedded IEEE 1149.1 Test Application Example},
  author={Fairchild Semiconductor},
  year={1998}
}
  • Fairchild Semiconductor
  • Published 1998
This application example discusses the implementation of embedded, system level boundary scan test within an actual design, the Fairchild boundary scan demonstration system. Its intent is to describe the decisions, actions and results when applying boundary scan and Fairchild’s SCAN EASE Software within a system. For more information see also AN-1022… CONTINUE READING