Applicability conditions and experimental analysis of the variable stripe length method for gain measurements

@inproceedings{Negro2004ApplicabilityCA,
  title={Applicability conditions and experimental analysis of the variable stripe length method for gain measurements},
  author={Luca Dal Negro and Paolo Bettotti and M Cazzanelli and Domenico Pacifici and Lorenzo Pavesi},
  year={2004}
}
We discuss here some crucial issues related to the validity of the variable stripe length (VSL) method to measure optical gain in semiconductor materials and we especially point out the main experimental as well as conceptual difficulties arising when the VSL method is barely applied to low gain materials such as silicon nanocrystals (Si-nc) devised in a planar waveguide geometry. The variable stripe length method is revised carefully considering all the basic assumptions of its underlying one… CONTINUE READING

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