Apertureless near-field optical microscope

@inproceedings{Zenhausern1999AperturelessNO,
  title={Apertureless near-field optical microscope},
  author={Frederic Zenhausern and Michael F. P. O’Boyle and H. K. Wickramasinghea and Thomas Watson},
  year={1999}
}
We demonstrate a new method whereby near-field optical microscope resolution can be extended to the nanometer regime. The technique is based on measuring the modulation of the scattered electric field from the end of a sharp silicon tip as it is stabilized and scanned in close proximity to a sample surface. Our initial results demonstrate resolution in the 3 nm range--comparable to what can be achieved with typical attractive mode atomic force microscopes. Theoretical considerations predict… CONTINUE READING

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