Anomalous narrowing of the structural relaxation dispersion of tris(dimethylsiloxy)phenylsilane at elevated pressures.

Abstract

Broadband dielectric relaxation measurements of tris(dimethylsiloxy)phenylsilane were made at ambient pressure and at elevated pressures. The data show an anomalous behavior not previously seen in any other glass-formers; namely, the structural alpha-relaxation loss peak narrows with increasing pressure and temperature at constant peak frequency… (More)

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@article{Pawlus2006AnomalousNO, title={Anomalous narrowing of the structural relaxation dispersion of tris(dimethylsiloxy)phenylsilane at elevated pressures.}, author={Sebastian Pawlus and Marian Paluch and Ewa Kamińska and K. L. Ngai}, journal={The journal of physical chemistry. B}, year={2006}, volume={110 15}, pages={7678-81} }