Announcing the Final Examination of Ekavut Kritchanchai for the degree of Doctor of Philosophy Time & Location: March 2, 2016 at 1:00 PM in HEC 450 Title: RF CIRCUIT DESIGNS FOR RELIABILITY AND PROCESS VARIABILITY RESILIENCE

  • Published 2017
Complementary metal oxide semiconductor (CMOS) radio frequency (RF) circuit design has been an ever-lasting research field. It has gained so much attention since RF circuits offer high mobility and wide-band efficiency, while CMOS technology provides the advantage of low cost and high integration capability. At the same time, CMOS device size continues to… (More)