Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs

  title={Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs},
  author={M. Baze and B. Hughlock and Jerry L. Wert and Joe Tostenrude and Lloyd W. Massengill and O. A. Amusan and R. Lacoe and Klas Lilja and M. Johnson},
  journal={IEEE Transactions on Nuclear Science},
SEU data on 90 nm structures displays a strong dependence on incident angle. A right parallelepiped (RPP) approximation is clearly not applicable to the observed response. This paper presents the data, possible mechanisms, and implications for testing and error rate predictions. 
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