Analyzing the impact of process variations on parametric measurements: Novel models and applications

@article{Reda2009AnalyzingTI,
  title={Analyzing the impact of process variations on parametric measurements: Novel models and applications},
  author={Sherief Reda and Sani R. Nassif},
  journal={2009 Design, Automation & Test in Europe Conference & Exhibition},
  year={2009},
  pages={375-380}
}
In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test structures. Based on multivariate statistical assumptions, we propose the use of the expectation-maximization algorithm to estimate any missing test measurements and to calculate accurately the statistical parameters of the underlying multivariate distribution. We also propose novel techniques to validate our statistical assumptions… CONTINUE READING
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