Analyzing integrated circuits at work with a picosecond time-gated imager.

Abstract

A system based on a picosecond time-gated image intensifier is proposed for non-contact testing of CMOS circuits. The apparatus allows one to record the temporal evolution of the luminescence emitted during transistor switching as a function of the position inside the chip. The system is characterized by an intrinsic parallelism in the spatial dimensions… (More)

Topics

Cite this paper

@article{Comelli2005AnalyzingIC, title={Analyzing integrated circuits at work with a picosecond time-gated imager.}, author={Dante Comelli and C. D'Andrea and Giovanni Valentini and Rinaldo Cubeddu and R. Casiraghi and Davide Cantarelli}, journal={Optics express}, year={2005}, volume={13 25}, pages={10075-84} }