Analyzing heap error behavior in embedded JVM environments


Recent studies have shown that transient hardware errors caused by external factors such as alpha particles and cosmic ray strikes can be responsible for a large percentage of system down-time. Denser processing technologies, increasing clock speeds, and low supply voltages used in embedded systems can worsen this problem. In many embedded environments, one… (More)
DOI: 10.1145/1016720.1016775


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@article{Chen2004AnalyzingHE, title={Analyzing heap error behavior in embedded JVM environments}, author={Guilin Chen and Mahmut T. Kandemir and Narayanan Vijaykrishnan and Anand Sivasubramaniam and Mary Jane Irwin}, journal={International Conference on Hardware/Software Codesign and System Synthesis, 2004. CODES + ISSS 2004.}, year={2004}, pages={230-235} }