Analyzing Fault Models for Reversible Logic Circuits

  title={Analyzing Fault Models for Reversible Logic Circuits},
  author={Jing Zhong and Jon C. Muzio},
  journal={2006 IEEE International Conference on Evolutionary Computation},
Reversible logic computing is a rapidly developing research area. Testing such circuits is obviously an important issue. In this paper, we consider a new fault model, labeled crosspoint faults, for reversible logic circuits. A randomized Automatic Test Pattern Generation algorithm targeting this specific kind of fault is introduced and analyzed. Simulation results show that the algorithm yields very good performance. The relationship between the crosspoint faults and stuck-at faults is also… CONTINUE READING
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