Analytical redundancy and the design of robust failure detection systems

  title={Analytical redundancy and the design of robust failure detection systems},
  author={Edward Yik Chow and Alan S. Willsky},
  journal={IEEE Transactions on Automatic Control},
  • E. Chow, A. Willsky
  • Published 1 July 1984
  • Business
  • IEEE Transactions on Automatic Control
The failure detection and identification (FDI) process is viewed as consisting of two stages: residual generation and decision making. It is argued that a robust FDI system can be achieved by designing a robust residual generation process. Analytical redundancy, the basis for residual generation, is characterized in terms of a parity space. Using the concept of parity relations, residuals can be generated in a number of ways and the design of a robust residual generation process can be… 

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