# Analytical determination of the complex dielectric function of an absorbing medium from two angles of incidence of minimum parallel reflectance

@article{Azzam1989AnalyticalDO, title={Analytical determination of the complex dielectric function of an absorbing medium from two angles of incidence of minimum parallel reflectance}, author={Rasheed M. A. Azzam}, journal={Journal of The Optical Society of America A-optics Image Science and Vision}, year={1989}, volume={6}, pages={1213-1216} }

The real and imaginary parts of the complex dielectric function (or complex refractive index) of an opaque substrate or a thick film can be determined from two pseudo-Brewster angles measured in two transparent incidence media of different refractive indices. This two-angle method is simple in that it involves no photometric or polarimetric analysis and in that the solution for the optical properties in terms of the measured angles is explicit, analytical, and direct (i.e. noniterative). The…

## 11 Citations

Angular range for reflection of p-polarized light at the surface of an absorbing medium with reflectance below that at normal incidence.

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A method for determining the real and imaginary parts of the complex refractive index, epsilon(1/2) = n + jk, which is based on measuring phi(e) and the pseudo-Brewster anglephi(pB), is viable in the domain of fractional optical constants.

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The locus of all points in the complex plane of the dielectric function ?[?(r) + j?(i) = |?| exp(jtheta)], that represent all possible interfaces characterized by the same pseudo-Brewster angle…

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